CD74HCT574-EP是TI公司的一款D类触发器产品，CD74HCT574-EP是增强型产品高速 Cmos 逻辑八路上升沿 D 类触发器，具有，本页介绍了CD74HCT574-EP的产品说明、应用、特性等，并给出了与CD74HCT574-EP相关的TI元器件型号供参考。
CD74HCT574-EP - 增强型产品高速 Cmos 逻辑八路上升沿 D 类触发器，具有 - D类触发器 - 触发器/锁存器/寄存器 - TI公司（Texas Instruments，德州仪器）
The CD74HCT574 is an octal D-type flip-flop with 3-state outputs and the capability to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the low-to-high transition of the clock (CP). The output enable (OE)\ controls the 3-state outputs and is independent of the register operation. When OE\ is high, the outputs are in the high-impedance state.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –40°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product Change Notification
- Qualification Pedigree
- Buffered Inputs
- Common 3-State Output-Enable Control
- 3-State Outputs
- Bus-Line Driving Capability
- Typical Propagation Delay (Clock to Q): 15 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
- Fanout (Over Temperature Range)
- Standard Outputs . . . 10 LSTTL Loads
- Bus Driver Outputs . . . 15 LSTTL Loads
- Balanced Propagation Delay and Transition Times
- Significant Power Reduction Compared to LSTTL Logic ICs
- VCC Voltage = 4.5 V to 5.5 V
- Direct LSTTL Input Logic Compatibility, VIL = 0.8 V (Max), VIH = 2 V (Min)
- CMOS Input Compatibility, Il ≤ 1 µA at VOL, VOH
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
