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SN74AC74-EP - 产品图解:
SN74AC74-EP-具有清零和预设功能的增强型产品双路上升沿 D 类触发器
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TI产品 - SN74AC74-EP介绍
SN74AC74-EP - 具有清零和预设功能的增强型产品双路上升沿 D 类触发器

SN74AC74-EP是TI公司的一款D类触发器产品,SN74AC74-EP是具有清零和预设功能的增强型产品双路上升沿 D 类触发器,本页介绍了SN74AC74-EP的产品说明、应用、特性等,并给出了与SN74AC74-EP相关的TI元器件型号供参考。

SN74AC74-EP - 具有清零和预设功能的增强型产品双路上升沿 D 类触发器 - D类触发器 - 触发器/锁存器/寄存器 - TI公司(Texas Instruments,德州仪器)

产品描述

The SN74AC74 is a dual positive-edge-triggered D-type flip-flop.

A low level at the preset (PRE)\ or clear (CLR)\ input sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the data (D) input meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at D can be changed without affecting the levels at the outputs.

产品特性

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Inputs Accept Voltages to 6 V
  • Max tpd of 10 ns at 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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