SN74LV595A-EP是TI公司的一款移位寄存器产品，SN74LV595A-EP是具有 3 态输出的增强型产品 8 位移位寄存器，本页介绍了SN74LV595A-EP的产品说明、应用、特性等，并给出了与SN74LV595A-EP相关的TI元器件型号供参考。
SN74LV595A-EP - 具有 3 态输出的增强型产品 8 位移位寄存器 - 移位寄存器 - 触发器/锁存器/寄存器 - TI公司（Texas Instruments，德州仪器）
The SN74LV595A device is an 8-bit shift register designed for 2-V to 5.5-V VCC operation.
This device contains an 8-bit serial-in, parallel-out shift register that feeds an 8-bit D-type storage register. The storage register has parallel 3-state outputs. Separate clocks are provided for both the shift and storage register. The shift register has a direct overriding clear (SRCLR)\ input, serial (SER) input, and a serial output for cascading. When the output-enable (OE)\ input is high, all outputs except QH’ are in the high-impedance state.
Both the shift register clock (SRCLK) and storage register clock (RCLK) are positive-edge triggered. If both clocks are connected together, the shift register always is one clock pulse ahead of the storage register.
To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 2-V to 5.5-V VCC Operation
- Max tpd of 7.4 ns at 5 V
- Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C
- Typical VOHV (Output VOH Undershoot) >2.3 V at VCC = 3.3 V, TA = 25°C
- Support Mixed-Mode Voltage Operation on All Ports
- 8-Bit Serial-In, Parallel-Out Shift
- Ioff Supports Partial-Power-Down Mode Operation
- Shift Register Has Direct Clear
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
